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Issues
Archives
Journal of the IEST
The Journal of Environmental Sciences
Journal of the IES
About IEST
Subscribe
Become a Member
Industry Partner
IEST.ORG
Contact IEST
Issue Info
Issues
Volume 45: Issue 1
Publication Date:
14 Sept 2002
Online ISSN:
1557-2196
Print ISSN:
1098-4321
Issues
Volume 45: Issue 1
Publication Date:
14 Sept 2002
Online ISSN:
1557-2196
Print ISSN:
1098-4321
Select Issue
Technical Papers
A Review of Analytical Techniques for Identifying Contaminants in the Semiconductor Industry
Victor Chia
DOI:
10.17764/jiet.45.1.f686p346016054p1
Abstract
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Internet Data Centers and the Infrastructure Require Environmental Design, Controls, and Monitoring
Clifford Frith
DOI:
10.17764/jiet.45.1.3r217535uu78v2r4
Abstract
Download PDF
Codes and Standards Resource for Semiconductor Fabrication Facilities
Jason Hailer
and
Allan Chasey
DOI:
10.17764/jiet.45.1.kh47g16u32x6u60l
Abstract
Download PDF
Benchmarking Time and Cost of Semiconductor Fabrication Facilities
Full access
Min He
,
Allan Chasey
, and
Sachin Patel
DOI:
10.17764/jiet.45.1.b34587k473744743
Abstract
Download PDF
Evaluating the Effectiveness of AMC Control Strategies with Reactivity Monitoring
Chris Muller
DOI:
10.17764/jiet.45.1.f6v70v738772n6x9
Abstract
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Measurement of Electrical Properties of Cleanroom Gloves
Carl Newberg
DOI:
10.17764/jiet.45.1.75v76m8015w5240u
Abstract
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How Clean Is It? The Use of Ion Chromatography to Monitor Contamination in Cleanroom Environments
Beverly Newton
DOI:
10.17764/jiet.45.1.u1r5u8087g535rl1
Abstract
Download PDF
Ozone Production by Corona Discharges
Charles Noll
DOI:
10.17764/jiet.45.1.p5643235m507702u
Abstract
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The Effects of Ambient Differential Pressure on Minienvironments, Isolation Enclosures, and Laminar Flow Devices
John Walters
DOI:
10.17764/jiet.45.1.fv7g6l7520n32585
Abstract
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End-to-End Mechanical Calibration of Strain Channels in Dynamic Health Monitoring Systems
David Banaszak
DOI:
10.17764/jiet.45.1.724270g325661067
Abstract
Download PDF
Certification of 200,000 g Shock Calibration Technique for Sensors
Vesta Bateman
and
Philip Thacker
DOI:
10.17764/jiet.45.1.34728u542k334619
Abstract
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Structural Response Loads in Force-Limited Vibration Testing
Kurng Chang
DOI:
10.17764/jiet.45.1.bv71nq036p238625
Abstract
Download PDF
An Integrated Acoustic Analysis Capability
Y. Lee
and
Jason Tolomeo
DOI:
10.17764/jiet.45.1.un4076n33w584p4m
Abstract
Download PDF
Force Limits Measured on a Space Shuttle Flight
Terry Scharton
DOI:
10.17764/jiet.45.1.k6g516h7447621r3
Abstract
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Planning Climatic Tests Using Physics-of-Failure Principles and Empirical Models
Z. Sherf
and
P. Hopstone
DOI:
10.17764/jiet.45.1.7g0g7w2505q87697
Abstract
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Problems in the Analysis of a Shock Sequence with Application to Gunfire Analysis and Simulation
Z. Sherf
,
P. Hopstone
,
G. Ostrovski
,
R. Klein
, and
D. Yehuda
DOI:
10.17764/jiet.45.1.p2q37w26674406r8
Abstract
Download PDF
A Family of Transients Suitable for Reproduction on a Shaker Based on the cos
m
(x) Window
David Smallwood
DOI:
10.17764/jiet.45.1.y279551q2x633818
Abstract
Download PDF
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Key Elements of a Successful Cleaning and Disinfection Program
James N. Polarine Jr.
and
Anne Marie Dixon-Heathman
The Next Chapter in the History of International Cleanroom Standards
Richard A. Matthews
and
Anne Marie Dixon-Heathman
ISO Technical Report 14644-21 Published to Support ISO 14644 Parts 1 and 2
John Hargreaves
and
Andrew Watson
Dealing with Force Limiting Error Due to Adaptive Fixturing Mass
Michael B. Van Dyke
Reliability Focused Six Sigma (RFSS) Approach
Hemant Urdhwareshe
and
Chetan Prabhu
A Sampling System for Measurement of Nanometer-Sized Particles in Hydrogen
Mark Malczewski
,
Arthur Holmer
, and
Hollis Demmin
Validation of Force-Limited Vibrating Testing
Daniel Worth
and
Daniel Kaufman
Tailoring Temperature/Humidity Life Tests with In-Service Environment Data
Kevin Cluff
and
Donald Barker
Operational Vibration Specification of Helicopter Stores Using Wavelet Analysis
Michael Hale
and
Reza Adhami
Orbital Experience from an Integration and Test Perspective
William Tosney
and
Andrew Quintero
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eISSN
: 1557-2196
ISSN
: 1098-4321
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