Journal of the IES Volume 36: Issue 6 | Journal of the IEST

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Volume 36: Issue 6

Cover Journal of the IES

Publication Date: 01 Nov 1993

Print ISSN: 1052-2883

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Peer-reviewed Technical Paper

Airborne Contamination on Semiconductor Wafers Traced to Humidification Plant Additives

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DOI: 10.17764/jiet.2.36.6.83844334773924m1

Testing in Combined Dynamic Environments

DOI: 10.17764/jiet.2.36.6.q467328r22x5077l

Improvements in Avionics-Durability Analyses

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DOI: 10.17764/jiet.2.36.6.9382613212802347

A Three-Dimensional UltrasonicAnemometer to Measure the Performance of Clean Zone Air Delivery Systems

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DOI: 10.17764/jiet.2.36.6.r05767v61tt13068

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Key Elements of a Successful Cleaning and Disinfection Program

James N. Polarine Jr. and

Anne Marie Dixon-Heathman

The Next Chapter in the History of International Cleanroom Standards

Richard A. Matthews and

Anne Marie Dixon-Heathman

ISO Technical Report 14644-21 Published to Support ISO 14644 Parts 1 and 2

John Hargreaves and

Andrew Watson

Dealing with Force Limiting Error Due to Adaptive Fixturing Mass

Michael B. Van Dyke

Reliability Focused Six Sigma (RFSS) Approach

Hemant Urdhwareshe and

Chetan Prabhu

Minimizing Defects for a Silicon Nitride Deposition Process

Jim Wilson and

Gary DcPinto

The Evaluation of Alternatives to Ozone-Depleting Chlorofluorocarbons

Robin Sellers

A Sequential Sampling Plan for Federal Standard 209

Douglas Cooper and

Dan Milholland

Lessons Learned in Vibro-Thermal Acoustic Tests

Petros Vasiliou

Replacing Chlorofluorocarbons in Industry

Kurt Weigel

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eISSN: 1557-2196

ISSN: 1098-4321

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