Rationale for Durability Temperature Test Compression

This paper describes temperature test compression strategy suitable for use with either commercial or military electronic products. An example, with calculations and supporting rationale, is presented for developing an accelerated temperature test profile for a representative electronics product based on actual conditions in its service environment. Both operating and nonoperating periods are considered over a full range of hot, cold, sunny, and cloudy days. Test compression is based on equivalent amounts of fatigue accumulation in the test laboratory and in actual service. Significant assumptions and variables that can affect estimates of fatigue accumulation and test validity are also discussed.